Defect Oriented Testing for CMOS Analog and Digital Circuits by Manoj Sachdev

By Manoj Sachdev

Disorder orientated trying out is anticipated to play an important function in coming generations of expertise. Smaller function sizes and bigger die sizes will make ICs extra delicate to defects that cannot be modeled by way of conventional fault modeling techniques. additionally, with elevated point of integration, an IC may perhaps include assorted construction blocks. Such blocks comprise, electronic common sense, PLAs, unstable and non-volatile stories, and analog interfaces. For such diversified construction blocks, conventional fault modeling and try methods will turn into more and more insufficient. disorder orientated trying out equipment have come far from a trifling fascinating educational workout to a difficult business fact. Many elements have contributed to its business reputation. conventional ways of checking out glossy built-in circuits (ICs) were came across to be insufficient when it comes to caliber and economics of try. In a globally aggressive semiconductor marketplace position, total product caliber and economics became extremely important targets. In addition, digital structures have gotten more and more advanced and call for parts of maximum attainable caliber. trying out, typically and, illness orientated checking out, particularly, assist in figuring out those pursuits. illness orientated trying out for CMOS Analog and electronic Circuits is the 1st publication to supply an entire evaluation of the topic. it's crucial studying for all layout and attempt pros in addition to researchers and scholars operating within the box. `A power of this e-book is its breadth. sorts of designs thought of contain analog and electronic circuits, programmable good judgment arrays, and thoughts. Having a fault version doesn't instantly offer a attempt. occasionally, layout for testability is important. Many layout for testability rules, supported via experimental proof, are included.' ... from the Foreword through Vishwani D. Agrawal

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Let us consider that the line A has a stuck-at-l (SAl) fault. 3 Levels of Fault Modeling tI SA1 A I B A B Z 0 0 1 0 1 1 1 0 1 1 1 0 z* 1 1 0 Fig. 2: The SAF model and its fault-free and faulty Boolean behavior. gate response when lines A and B are driven to logic 0 and I, respectively. A fault is said to be detected when the expected output of the logic gate differs from the actual output. For example, the third and fourth columns of the table in Fig. 2 illustrate the expected (fault-free, Z) and the actual (faulty, Z*) responses of the NAND gate.

As line widths are scaled into deep sub-micron regime and device switching speed continues to improve, however, delays due to interconnects have not scaled. In fact, the interconnect resistance has increased due to smaller cross sectional area. Furthermore, there is no significant decrease in the interconnect capacitance. Therefore, interconnect RC product has increased [4,7,26,73]. Therefore, gate delay fault model is restrictive in its application to finer geometries. Furthermore, the gate delay fault model can not account for the cumulative effect of small delay variations along paths from primary inputs to primary outputs.

Typically, small leakage faults do not cause a catastrophic failure of an IC. However, they are potential reliability hazards [81]. 7 Temporary Faults Unlike most other faults, the temporary faults can not be classified according to levels of fault modeling. Therefore, they should be treated separately. As their name suggests, temporary faults are not permanent in nature. A major portion of digital system malfunctions is caused by temporary faults. They are harder to detect because at the time of testing they are not reproduced.

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