Beam Effects, Surface Topography, and Depth Profiling in by John H. Thomas III (auth.), Alvin W. Czanderna, Theodore E.

By John H. Thomas III (auth.), Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell (eds.)

Many books can be found that aspect the elemental rules of different tools of floor characterization. however, the clinical literature offers a source of the way person items of study are carried out by means of specific labo- tories. among those extremes the literature is skinny however it is the following that the current quantity very easily sits. either the newcomer and the extra mature scientist will locate in those chapters a wealth of aspect in addition to recommendation and basic tips of the important phenomena correct to the examine of genuine samples. within the research of samples, functional analysts have relatively basic types of the way every little thing works. Superimposed in this excellent international is an realizing of ways the parameters of the dimension process, the instrumentation, and the char- teristics of the pattern distort this perfect global into anything much less detailed, much less managed, and not more understood. The information given in those chapters permits the scientist to appreciate tips to receive the main particular and understood measu- ments which are at present attainable and, the place there are inevitable difficulties, to have transparent tips because the quantity of the matter and its most probably behavior.

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R. Anderson, R. N. Lee, J. F. Morar, and R. L. Park, J. Vac. Sci, Technol. 20, 617 (1982). C. D. Wagner and P. Biloen, Surf. Sci. 35, 82 (1973). C. D. Wagner, Faraday Discuss. Chem. Soc. 60, 291 (1975). C. D. Wagner, D. E. Passoja, H. F. Hillery, T. F. Kinisky, H. A. Six, W. I. Jansen, and J. A. Taylor, J. Vac. Sci. Technol. 21, 933 (1982); C. D. Wagner, in: Practical Surface Analysis, (D. Briggs and M. P. ), J. Wiley, New York (1990), pp. 595–634. C. D. Wagner, W. M. Riggs, L. E. Davis, J. F. Moulder, and G.

49. 50. 51. 52. 53. 54. M. P. Seah and M. T. Anthony, Surf. Interface Anal. 6, 95 (1984). C. J. Powell, App. Surf. Sci. 89, 141 (1995). R. J. Bird and P. Swift, J. Electron Spectrosc. Rel. Phenom. 21, 227 (1980). R. N. Lee, J. Electron Spectrosc. Rel. Phenom. 28, 195 (1982). S. Kohiki and K. Oki, J. Electron Spectrosc. Rel. Phenom. 33, 375 (1984). N. I. Nefedov, Y. V. Salyn, G. Leonhardt, and R. Scheibe, J. Electron Spectrosc, Rel. Phenom. 10, 121 (1977). D. T. Clark, A. Dilks, and H. R. Thomas, J.

But, at higher oxygen pressures, electron beam exposure enhances the continued oxidation of the surface. This result is due to dissociation of by the electron beam and the diffusion of these dissociated species into the bulk. The Auger signal tends toward saturation at a high pressure of oxidation in the “beam-on” condition because the oxide layer thickness approaches the oxygen Auger electron escape depth. ) These investigators(41) noted that at a lower beam energy of 500 eV, the effect was less prevalent, and it was Electron Beam Damage at Solid Surfaces 47 48 Carlo G.

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